リチウムイオンを注入したMgIn<sub>2</sub>O<sub>4</sub>薄膜の高いキャリア電子生成

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タイトル別名
  • High Efficiency-Carrier-Generation in Li<sup>+</sup>-Implanted MgIn<sub>2</sub>O<sub>4</sub> Thin Films
  • High Efficiency Carrier Generation in L

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Optically transparent MgIn2O4 thin films were prepared on SiO2 glass substrates by a radio-frequency sputtering method. Direct current conductivity of the as-sputtered film was lower than 10-9S·cm-1. Lithium ions were implanted to the films at room temperature to a total fluence of 2×1015cm-2. Carrier electrons were generated by the implantation. Conductivity of the as-implanted film was 8×10-2S·cm-1 and the carrier-generation-efficiency was -2%. By the post-annealing at 300°C, the efficiency drastically increased to -80% and the conductivity increased to 3S·cm-1. These results indicate that the inactive Li+ ions in the asimplanted films are incorporated into the electrically active lattice sites during the post-annealing.

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