多数球形欠陥まわりの直流電位場解析

• 多田 直哉

• 中山 英介

• 北村 隆行

• 大谷 隆一

書誌事項

タイトル別名

• Analysis of Direct Current Potential Field around Multiple Spherical Defect.
• タスウ キュウケイ ケッカンマワリ ノ チョクリュウ デンイバ カイセキ

抄録

A method for evaluating the distribution of electrical potential around multiple spherical defects was proposed. As the method is based on the known solution for a single defect, the electric field can be efficienly analyzed in comparison with the other methods, such as the finite element method. The electric field in a conductive material with multiple spherical defects at random locations is estimated by the method. The analysis shows that the increase in the potential difference normalized by the potential difference without defects, ΔV/V₀, is in proportion to the product of the volumetric density of defects and the mean of cubed defect radius, n_v [r³]_m. The universal relationship is independent of the location of defects and the distribution of defect radius. Thus, the damage due to the multiple defects can be evaluated by the increase in potential difference.

収録刊行物

• 日本機械学会論文集Ａ編

  日本機械学会論文集Ａ編 65 (632), 693-700, 1999

  一般社団法人 日本機械学会

キーワード

• Numerical Analysis
• Nondestructive Inspection
• Electric Potential Difference
• Multiple Spherical Defects
• Direct Current
• Defect-Current Modification Method

詳細情報

• CRID: 1390001204446896768
• NII論文ID: 110002374935
• NII論文ID: 10008201749
• NII書誌ID: AN0018742X
• DOI: 10.1299/kikaia.65.693
• ISSN: 18848338
• ISSN: 03875008
• NDL書誌ID: 4707008
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I4707008
• Web Site: http://www.jstage.jst.go.jp/article/kikaia1979/65/632/65_632_693/_pdf
• 本文言語コード: ja
• データソース種別:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• 抄録ライセンスフラグ: 使用不可