書誌事項
- タイトル別名
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- Positional Detection Characteristics of Nano-CMM Laser Trapping Probe Based on Linnik Interferometer
抄録
We have been developing the new probe technique for the nano-CMM, that is called the laser trapping probe whose principle is based on single-beam gradient-force optical trapping techniques and microscope interferometers. The work reported in this paper deals with fundamental characteristics on the practical positional detection and measurements of a glass microsphere with National Institute of Standards and Technology (NIST) traceable mean diameter of 168±8.4μm using the laser trapping probe based on Linnik interferometer. Positional detection is based on displacement of a microprobe sphere caused by external forces at the position where it approximates to a workpiece. Linnik interferometer performs sensing this displacement with high accuracy. Measurement results of the glass micro-sphere demonstrate a potentiality of the laser trapping probe as a positional detection probe for the nano-CMM.
収録刊行物
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- 生産加工・工作機械部門講演会 : 生産と加工に関する学術講演会
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生産加工・工作機械部門講演会 : 生産と加工に関する学術講演会 2000.2 (0), 203-204, 2000
一般社団法人 日本機械学会
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詳細情報 詳細情報について
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- CRID
- 1390282680876396928
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- NII論文ID
- 110002485294
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- ISSN
- 24243094
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可