書誌事項
- タイトル別名
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- Development of Phase-retrieval measuring System for 3D Micromachined Surface Profile Measurement
抄録
In this paper, we propose an optical measurement method that can be applied to the in-process measurement of microsurface profile with an accuracy on the nanometer order. Surface profiles are reconstructed by measuring two intensity distributions. Fraunhofer diffraction pattern of coherently illuminated work surface and an optical microscopic image. In this method, the whole illuminated profile can be measured at one time and no scanning procedure is imposed, and measurement is not likely to be affected by vibration and tilt of work. For higher resolution, the new instrument is designed and developed, and measurements of Fraunhofer diffraction including higher order diffraction intensities for an ultra precision grid plate standard is presented.
収録刊行物
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- 年次大会講演論文集
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年次大会講演論文集 2002.5 (0), 289-290, 2002
一般社団法人 日本機械学会
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詳細情報 詳細情報について
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- CRID
- 1390001206057810816
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- NII論文ID
- 110002524478
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- ISSN
- 24331325
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可