Test Generation Algorithms (<Special Issue> VLSI-CAD and Artificial Intelligence)

• FUJIWARA Hideo

  Dept. of Computer Science, Meiji University

Bibliographic Information

Other Title

• テスト生成アルゴリズム (<特集>「VLSI-CADと人工知能」)

Journal

• Journal of the Japanese Society for Artificial Intelligence

  Journal of the Japanese Society for Artificial Intelligence 8 (2), 166-172, 1993-03-01

  The Japanese Society for Artificial Intelligence

Keywords

• algorithms
• computational complexity
• fault model
• heuristics
• logic circuits
• neural networks
• test generation

Details

• CRID: 1390848647558868992
• NII Article ID: 110002807648
• NII Book ID: AN10067140
• DOI: 10.11517/jjsai.8.2_166
• ISSN: 24358614
• ISSN: 21882266
• Text Lang: ja
• Data Source:
  • JaLC
  • CiNii Articles