ゲルクロマトグラフィー/誘導結合プラズマ質量分析法による微量ケイ素の間接定量
書誌事項
- タイトル別名
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- Indirect determination of trace amounts of silicon by ICP-MS after separation by gel chromatography.
- ゲル クロマトグラフィー ユウドウ ケツゴウ プラズマ シツリョウ ブンセキホ
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抄録
An indirect determination of trace amounts of silicon by ICP-MS based on the determination of molybdenum originating from molybdosilicic acid has been investigated. It was found that molybdosilicic acid is strongly adsorbed on a Sephadex gel column from a nitric acid medium and can be easily eluted with ammonia water, whereas molybdate ion is not adsorbed on the gel column. The gel consisted of dextran cross-linked by epichlorohydrin. Molybdosilicic acid was formed by the procedure of JIS H 1422. Molybdenum-98 in the eluate was determined by ICP-MS after eliminating ammonia from it by boiling. This method was applied to the analysis of high purity copper.
収録刊行物
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- 分析化学
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分析化学 38 (5), 224-227, 1989
公益社団法人 日本分析化学会
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詳細情報 詳細情報について
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- CRID
- 1390001204354195840
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- NII論文ID
- 110002904968
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- NII書誌ID
- AN00222633
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- NDL書誌ID
- 3234148
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- ISSN
- 05251931
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
- Crossref
- NDL-Digital
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可