表面増強赤外吸収スペクトル法による果実表面の残留添加物の分析

• 西川 雄司

  コニカ(株)感材技術研究所

• 藤原 国広

  コニカ(株)感材技術研究所

• 高村 喜代子

  東京薬科大学

書誌事項

タイトル別名

• Trace analysis of residual additives on the surface of cultivated fruits by surface-enhanced infrared spectroscopy.
• ヒョウメン ゾウキョウ セキガイ キュウシュウ スペクトルホウ ニ ヨル カジ

抄録

Surface-enhanced infrared spectroscopy was applied to the trace analysis of residual additives on several agricultural product surfaces. The surface species were transferred onto silver-coated barium fluoride substrates by pressing the substrates. To clarify the optimum sampling conditions, the effects of the pressure and pressure time were examined with the use of model samples (polyethyleneterephthalate films coated with several amounts of silicone resin). The best obtained conditions were 200g/cm² and 1 min.The correlation between the amounts of surface silicone and the SEIRA intensity was also studied. A good correlation was obtained between the sample amounts of 50200ng/cm². The method was actually applied to four different cultivated fruits (lemon, grapefruit, cherry and mandarin orange). Small amounts of silicone additive were identified from the lemon, grapefruit and cherry surfaces. These fruits were produced in foreign countries.

収録刊行物

• 分析化学

  分析化学 43 (5), 425-429, 1994

  公益社団法人 日本分析化学会

キーワード

• surface-enhanced infrared spectroscopy
• silver film
• trace analysis
• cultivated fruits
• silicone resin
• food additives

詳細情報

• CRID: 1390001204051529344
• NII論文ID: 110002906775
• NII書誌ID: AN00222633
• DOI: 10.2116/bunsekikagaku.43.425
• COI: 1:CAS:528:DyaK2cXktlent74%3D
• NDL書誌ID: 3884741
• ISSN: 05251931
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I3884741
• Web Site: http://www.jstage.jst.go.jp/article/bunsekikagaku1952/43/5/43_5_425/_pdf
• Web Site: http://dl.ndl.go.jp/info:ndljp/pid/10893339
• 本文言語コード: ja
• データソース種別:
  • JaLC
  • NDL
  • Crossref
  • NDL-Digital
  • CiNii Articles
• 抄録ライセンスフラグ: 使用不可