Measurement of Microdeformation by Transparent-Type Diffraction Moire Interferometry Using Light Control Plate

• MORIMOTO Yoshiharu

  Department of Industrial Engineering, Faculty of Economics, Wakayama University

• UCHIDA Hiroaki

  Hokuriku Electric Power Company

抄録

Moire interferometry is a method of measuring submicron displacement distribution using two or four collimated beams incident to a specimen diffraction grating. In this paper, in order to form these two or four beams, a transparent diffraction grating is used. Two types of transparent diffraction moire interferometry are developed. One uses oblique incident beams for measuring one-dimensional displacement. The other uses normal incident beams for measuring one- or two-dimensional displacement components. In the latter, the 0th-order diffraction beam is noise. This noise is removed using light control plates which were developed recently. By using this diffraction moire interferometry, a compact system for microdeformation measurement is developed.

収録刊行物

• JSME international journal. Ser. A, Mechanics and material engineering

  JSME international journal. Ser. A, Mechanics and material engineering 38 (1), 73-79, 1995-01-01

  一般社団法人日本機械学会

キーワード

• Experimental Stress Analysis
• Material Testing
• Nondestructive Testing
• Moire Interferometry
• Microdeformation
• Light Control Plate

詳細情報

• CRID: 1571698602110945920
• NII論文ID: 110002964256
• NII書誌ID: AA10888746
• ISSN: 09148809
• 本文言語コード: en
• データソース種別:
  • CiNii Articles