ミリ波同軸励振空洞共振器法による誘電体平板の複素誘電率測定  [in Japanese] Millimeter wave measurements of complex permittivity of dielectric plates by a cavity resonance method based on coaxial excitation  [in Japanese]

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Author(s)

Abstract

本報告では、ミリ波帯において、低損失誘電体平板材料の複素誘電率を測定するために、モードマッチング法による厳密な数値解析に基づいた同軸励振空洞共振器法を提案する。この測定方法を用いて、GaAs平板、PTFE平板、Crythnex平板の複素誘電率を室温において測定した。また、GaAs平板の複素誘電率の周波数依存性を10GHz-40GHzの範囲で測定した。

A novel circular resonance method based on a rigorous analysis by the mode matching technique is proposed to measure the complex permittivity of low loss dielectric plates accurately in the millimeter wave region. By this method, the complex permittivity for GaAs plate, PTFE plate and Crythnex plate were measured at room temperature, and the frequency dependence of complex permittivity for GaAs plates were measured in the frequency range 10 to 40GHz. It is verified that this method is useful as a precise measurement method of the permittivity of low loss dielectric plates in the microwave and millimeter wave regions.

Journal

  • IEICE technical report. Microwaves

    IEICE technical report. Microwaves 99(78), 73-76, 1999-05-21

    The Institute of Electronics, Information and Communication Engineers

References:  6

Cited by:  10

Codes

  • NII Article ID (NAID)
    110003189978
  • NII NACSIS-CAT ID (NCID)
    AN10013185
  • Text Lang
    JPN
  • Article Type
    Journal Article
  • ISSN
    09135685
  • NDL Article ID
    4759458
  • NDL Source Classification
    ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
  • NDL Call No.
    Z16-940
  • Data Source
    CJP  CJPref  NDL  NII-ELS 
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