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- GOTO Tomoaki
- the Production Technology Laboratory, Fuji Electric Co., Ltd.
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- MATSUSHITA Kouji
- the Production Technology Laboratory, Fuji Electric Co., Ltd.
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- HIRONO Katsumi
- the Production Technology Laboratory, Fuji Electric Co., Ltd.
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A conventional anode coupled plasma etching process has been developed to etch 300μm-deep cavities and 600μm-through holes with nearly vertical sidewalls into single crystal silicon. An optimized SF_6/O_2 gas mixture results in a nearly vertical etching profile. A silicon wafer was fabricated with a large number of cavities and through holes with less than 1 percent uniformity. It was also experimentally confirmed that this process can be used to etch vertical cavities and through holes in single-crystal silicon with any orientation. This process has the advantage of unlimited etching depth and etching patterns. Advantages in mechanical strength are obtained because a micro-curve is formed at the bottom edge of the cavities. This etching process developed on a conventional plasma etching system was utilized to fabricate a torsional vibrator that consists of single-crystal silicon and Pyrex glass.
収録刊行物
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- IEICE transactions on electronics
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IEICE transactions on electronics 78 (2), 167-173, 1995-02-25
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詳細情報 詳細情報について
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- CRID
- 1573668927255575040
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- NII論文ID
- 110003210827
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- NII書誌ID
- AA10826283
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- ISSN
- 09168524
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- 本文言語コード
- en
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- データソース種別
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- CiNii Articles