Electro-Optic Testing Technology for High-Speed LSIs

• NAGATSUMA Tadao

  NTT LSI Laboratories

抄録

With increases in the speed of semiconductor devices and integrated circuits, the importance of internal testing with suffiicient temporal resolution has been growing. This paper describes recently established electro-optic testing technologies based on pulse lasers and electro-optic crystal probes. Practicability, limitation and future issues are discussed.

収録刊行物

• IEICE transactions on electronics

  IEICE transactions on electronics 79 (4), 482-488, 1996-04-25

  一般社団法人電子情報通信学会

キーワード

• electro-optics
• Pockels effect
• sampling
• pulse laser
• testing

詳細情報

• CRID: 1571698602417697152
• NII論文ID: 110003211043
• NII書誌ID: AA10826283
• ISSN: 09168524
• 本文言語コード: en
• データソース種別:
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