0.21-fJ GaAs DCFL Circuits Using 0.2-μm Y-Shaped Gate AlGaAs/InGaAs E/D-HJFETs

• WADA Shigeki

  Optoelectronics and High Frequency Device Research Laboratories, NEC Corporation

• TOKUSHIMA Masatoshi

  Optoelectronics and High Frequency Device Research Laboratories, NEC Corporation

• ISHIKAWA Masaoki

  Optoelectronics and High Frequency Device Research Laboratories, NEC Corporation

• YOSHIDA Nobuhide

  Optoelectronics and High Frequency Device Research Laboratories, NEC Corporation

• FUJII Masahiro

  Optoelectronics and High Frequency Device Research Laboratories, NEC Corporation

• MAEDA Tadashi

  Optoelectronics and High Frequency Device Research Laboratories, NEC Corporation

抄録

Ultra-low-power-consumption and high-speed DCFL circuits have been fabricated by using 0.2-μm Y-shaped gate E/D-heterojunction-FETs (HJFETs) with a high-aspect-ratio gate-structure, which has an advantage of reducing the gate-fringing capacitance (C_f) to about a half of that of a conventional low-aspect-ratio one. A fabricated 51-stage ring oscillator with the 0.2-μm Y-shaped gate n-AlGaAs/i-InGaAs E/D-HJFETs shows the lowest power-delay product of 0.21 fJ with an unloaded propagation delay of 34.9ps at a supply voltage (V_<DD>) of 0.4 V. We also analyze the DCFL switching characteristics by taking into account the intrinsic gate-to-source capacitance (C^<int>_<gs>) and the C_f. The analysis results for the power-delay products agree well with our experimental results. Our analysis also indicates the DCFL circuit with the high-aspect-ratio Y-shaped gate E/D-HJFETs can reduce the power-delay products by 35% or more below 0.25-μm gate-length as compared to conventional ones with the low-aspect-ratio Y-shaped gate HJFETs. These results clarify that the C_f-reduction of the Y-shaped gate HJFETs is more effective in improving the power-delay products than reducing the gate-length.

収録刊行物

• IEICE transactions on electronics

  IEICE transactions on electronics 82 (3), 491-497, 1999-03-25

  一般社団法人電子情報通信学会

キーワード

• GaAs
• heterojunction FET
• Y-shaped gate
• DCFL
• low supply voltage

詳細情報

• CRID: 1572824502325108992
• NII論文ID: 110003211683
• NII書誌ID: AA10826283
• ISSN: 09168524
• 本文言語コード: en
• データソース種別:
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