Frequency Dependence Measurements of Surface Resistance of Superconductors Using Four Modes in a Sapphire Rod Resonator
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- HASHIMOTO Toru
- Faculty of Engineering, Saitama University
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- KOBAYASHI Yoshio
- Faculty of Engineering, Saitama University
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The frequency dependence of surface resistance R_s of high temperature superconductor (HTS) films are measured by a novel measurement method using four TE_<0mp> modes in a sapphire rod resonator. At first, a loss tangent tan δ of the sapphire rod and R_s of the HTS films are evaluated separately from the results measured for the TE_<021> and TE_<012 >modes with close resonant frequencies. Secondly, R_s values at two different resonant frequencies for the TE_<011> and TE_<022> modes are measured using a well-known relation for sapphire tan δ/f = constant, where f is a frequency. R_s values of HoBa_2Cu_3O_<7-x> thin films were measured in the frequency range of 10 to 43 GHz by using four sapphire rod resonators with different sizes. As a result, it is found that these measured results of R_s have a characteristic of frequency square.
収録刊行物
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- IEICE transactions on electronics
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IEICE transactions on electronics 86 (8), 1721-1728, 2003-08-01
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詳細情報 詳細情報について
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- CRID
- 1573950402231501568
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- NII論文ID
- 110003214724
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- NII書誌ID
- AA10826283
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- ISSN
- 09168524
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- 本文言語コード
- en
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- データソース種別
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- CiNii Articles