Frequency Dependence Measurements of Surface Resistance of Superconductors Using Four Modes in a Sapphire Rod Resonator

• HASHIMOTO Toru

  Faculty of Engineering, Saitama University

• KOBAYASHI Yoshio

  Faculty of Engineering, Saitama University

Abstract

The frequency dependence of surface resistance R_s of high temperature superconductor (HTS) films are measured by a novel measurement method using four TE_<0mp> modes in a sapphire rod resonator. At first, a loss tangent tan δ of the sapphire rod and R_s of the HTS films are evaluated separately from the results measured for the TE_<021> and TE_<012 >modes with close resonant frequencies. Secondly, R_s values at two different resonant frequencies for the TE_<011> and TE_<022> modes are measured using a well-known relation for sapphire tan δ/f = constant, where f is a frequency. R_s values of HoBa_2Cu_3O_<7-x> thin films were measured in the frequency range of 10 to 43 GHz by using four sapphire rod resonators with different sizes. As a result, it is found that these measured results of R_s have a characteristic of frequency square.

Journal

• IEICE Trans. Electron., C

  IEICE Trans. Electron., C 86 (8), 1721-1728, 2003-08-01

  The Institute of Electronics, Information and Communication Engineers

Keywords

• high-Tc superconductors
• microwave
• surface resistance
• frequency dependence

Details

• CRID: 1573950402231501568
• NII Article ID: 110003214724
• NII Book ID: AA10826283
• ISSN: 09168524
• Text Lang: en
• Data Source:
  • CiNii Articles