Back-Irradiation Type Photo-Detector Arrays Using Field Emitter Device
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- ONO Takashi
- The authors are with the Department of Electrical and Electronic Engineering, Faculty of Engineering, Toyohashi University of Technology
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- SAWADA Kazuaki
- The authors are with the Department of Electrical and Electronic Engineering, Faculty of Engineering, Toyohashi University of Technology
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- JUNG Young Chul
- The author is with the School of Computer and Electronics Engineering, Kyongju University
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- MORIYASU Yoshitaka
- The author is with Central Technology Laboratory, Asahikasei Corporation
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- TAKAO Hidekuni
- The authors are with the Department of Electrical and Electronic Engineering, Faculty of Engineering, Toyohashi University of Technology
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- ISHIDA Makoto
- The authors are with the Department of Electrical and Electronic Engineering, Faculty of Engineering, Toyohashi University of Technology
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Abstract
A new type of photodetector called "photosensitive floating field emitter, (PFFE)" has been proposed. The PFFE device combines an n-type cone-shaped triode field emitter with a-Si p-i-n photodiode film. However, a PFFE cannot detect two-dimensional distributions of light intensity. In this paper, we propose a novel structure to overcome the above this problem of the PFFE. The device was fabricated on a silicon-on-sapphire substrate to permit irradiation from the backside, p-n photodiodes were constructed within a field emitters, the n+ region being separated by p+ regions to permit detection of two- dimensional light distributions. The emission current of the PFFE/SOS was found to be proportional to the illumination intensity, but the quantum efficiency was only about 2%. This quantum efficiency is lower than that expected. Under irradiation, the emission current increased, but the gate-leakage current increased. This gate-leakage current was several orders of magnitude larger than the emission current. Almost photo-generated electrons lost in the gate electrode.
Journal
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- IEICE TRANS. ELECTRON.
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IEICE TRANS. ELECTRON. 86 (9), 1805-1809, 2003-09-01
The Institute of Electronics, Information and Communication Engineers
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Details 詳細情報について
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- CRID
- 1574231877208204416
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- NII Article ID
- 110003214736
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- NII Book ID
- AA10826283
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- ISSN
- 09168524
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- Text Lang
- en
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- Data Source
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- CiNii Articles