High-Speed Demonstration of SFQ Circuit Based on Cell-Based Design Method

• AKAHORI Akira

  Department of Quantum Engineering, Nagoya University

• TANAKA Masamitsu

  Department of Electronics, Nagoya University

• SEKIYA Akito

  Department of Information Electronics, Nagoya University

• FUJIMAKI Akira

  Department of Quantum Engineering, Nagoya University

• HAYAKAWA Hisao

  Department of Quantum Engineering, Nagoya University

収録刊行物

• IEICE transactions on electronics

  IEICE transactions on electronics 85 (11), 1947-, 2002-11-01

  一般社団法人電子情報通信学会

キーワード

• on-chip test system
• HalfAdder
• Cell-Based
• design method

詳細情報

• CRID: 1571417127294309632
• NII論文ID: 110003223407
• NII書誌ID: AA10826283
• ISSN: 09168524
• 本文言語コード: en
• データソース種別:
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