サファイア共振器を用いたYBCO薄膜の表面抵抗測定に関する検討  [in Japanese] Discussions on surface resistance measurement of YBCO films using sapphire resonators.  [in Japanese]

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Author(s)

Journal

  • Proceedings of the IEICE General Conference

    Proceedings of the IEICE General Conference, 130, 1999

    The Institute of Electronics, Information and Communication Engineers

Cited by:  2

Codes

  • NII Article ID (NAID)
    110003254343
  • NII NACSIS-CAT ID (NCID)
    AN10471452
  • Text Lang
    JPN
  • Article Type
    Proceedings
  • Data Source
    CJPref  NII-ELS 
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