Numerical Derivative Analysis of the Pseudodielectric Function of CdTe

• Kimura Toshifumi

  Department of Electronic Engineering, Faculty of Engineering, Gunma University

• Adachi Sadao

  Department of Electronic Engineering, Faculty of Engineering, Gunma University

抄録

The real (ε₁) and imaginary (ε₂) parts of the dielectric function for CdTe have been measured by spectroscopic ellipsometry in the 1.1–5.6–eV photon-energy range at room temperature. The measured spectra reveal distinct structures at energies of the E₀, E₀+Δ₀, E₁, E₁+Δ₁ and E₂ oritical points (CPs). These data are analyzed by fitting the first-(dε⁄dE) or second-derivative spectra (d²ε⁄dE²) with model dielectric functions (MDF) or standard critical-point (SCP) line shapes. It is found that both the MDF and SCP models successfully explain the measured derivative spectra. The MDF also shows excellent agreement with the experimental ε(ω) spectra, but the SCP does not. The CP energies determined here are: E₀=1.58 eV; E₀+Δ₀=2.55 eV; E₁=3.55 eV; E₁+Δ₁=4.13 eV; and E₂=5.13 eV.

収録刊行物

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 32 (6), 2740-2745, 1993

  社団法人応用物理学会

キーワード

• CdTe
• dielectric function
• dielectric constant
• spectroscopic ellipsometry
• critical
• point
• exciton

詳細情報

• CRID: 1571135652377117568
• NII論文ID: 110003899718
• NII書誌ID: AA10457675
• 本文言語コード: en
• データソース種別:
  • CiNii Articles