Observation of Atomic Defects on LiF(100) Surface with Ultrahigh Vacuum Atomic Force Microscope (UHV AFM)

• Ohta Masahiro

  Department of Physics, Faculty of Science, Hiroshima University

• Konishi Takefumi

  Department of Physics, Faculty of Science, Hiroshima University

• Sugawara Yasuhiro

  Department of Physics, Faculty of Science, Hiroshima University

• Morita Seizo

  Department of Physics, Faculty of Science, Hiroshima University

• Suzuki Mineharu

  NTT Interdisciplinary Research Laboratories

• Enomoto Yuji

  Mechanical Engineering Laboratory

抄録

We have constructed an atomic force microscope (AFM) operating under an ultrahigh vacuum (UHV). We have imaged the cleaved (100) surface of LiF ionic crystal to clarify the AFM’s performance. As a result, for the first time, we have obtained atomically resolved AFM images of atomic defects penetrating the surface. This result seems to suggest that the cleaved LiF (100) surface was imaged under the condition of monoatomic or small cluster tip-sample interaction.

収録刊行物

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 32 (6), 2980-2982, 1993

  社団法人応用物理学会

キーワード

• atomic defect
• UHV AFM
• atomic force microscope
• AFM
• LiF
• atomic resolution
• edge dislocation

詳細情報

• CRID: 1572824502237387904
• NII論文ID: 110003899764
• NII書誌ID: AA10457675
• 本文言語コード: en
• データソース種別:
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