In-plane Orientation and Coincidence Site Lattice Relation of Bi₂Sr₂CaCu₂O_x Thin Films Formed on Highly Mismatched (001) YAG Substrates

• Kataoka Masayuki

  Semiconductor Research Laboratory, Mitsubishi Electric Coporarion, Tsukaguchi–Honmachi, Amagasaki, Hyogo 661

• Kuroda Ken"ichi

  Semiconductor Research Laboratory, Mitsubishi Electric Coporarion, Tsukaguchi–Honmachi, Amagasaki, Hyogo 661

• Oishi Toshiyuki

  Semiconductor Research Laboratory, Mitsubishi Electric Coporarion, Tsukaguchi–Honmachi, Amagasaki, Hyogo 661

• Takami Tetsuya

  Semiconductor Research Laboratory, Mitsubishi Electric Coporarion, Tsukaguchi–Honmachi, Amagasaki, Hyogo 661

• Furukawa Akihiko

  Semiconductor Research Laboratory, Mitsubishi Electric Coporarion, Tsukaguchi–Honmachi, Amagasaki, Hyogo 661

• Tanimura Junji

  Materials and Electronic Devices Laboratory, Mitsubishi Electric Corporation, Tsukaguchi–Honmachi, Amagasaki, Hyogo 661

• Ogama Tetsuo

  Materials and Electronic Devices Laboratory, Mitsubishi Electric Corporation, Tsukaguchi–Honmachi, Amagasaki, Hyogo 661

• Kojima Kazuyoshi

  Semiconductor Research Laboratory, Mitsubishi Electric Coporarion, Tsukaguchi–Honmachi, Amagasaki, Hyogo 661

書誌事項

タイトル別名

• In-plane Orientation and Coincidence Site Lattice Relation of Bi2Sr2CaCu2Ox Thin Films Formed on Highly Mismatched (001) YAG Substrates.

抄録

The symmetry-related in-plane misorientation is investigated in an highly mismatched system of (001) Bi₂Sr₂CaCu₂O _x(2212) thin films on (001) cubic substrates with 12 Å lattice length. Irregular in-plane orientation of 2212[510]// Sub.[120] is expected on the basis of the coincidence site lattice theory. This expectation is realized using (001)YAG (yttrium aluminium garnet) substrates. The atomic structure model is shown with regard to the interface between (001)2212 film and the (001)YAG surface.

収録刊行物

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 33 (1B), 929-931, 1994

  The Japan Society of Applied Physics

キーワード

• superconductor
• interface
• highly mismatched system
• coincidence site lattice
• orientation
• YAG

詳細情報

• CRID: 1390001206246797568
• NII論文ID: 210000036443
• NII論文ID: 110003902951
• NII書誌ID: AA10457675
• DOI: 10.1143/jjap.33.929
• ISSN: 13474065
• ISSN: 00214922
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.33.929
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.33.929/pdf
• 本文言語コード: en
• データソース種別:
  • JaLC
  • Crossref
  • CiNii Articles
• 抄録ライセンスフラグ: 使用不可