Measurement of Temperature Dependence of Dielectric Permittivity of Sapphire Window for High Power Gyrotrons
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- Takahashi Koji TAKAHASHI Koji
- Japan Atomic Energy Research Institute, Naka Fusion Research Establishment
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- Kasugai Atsushi KASUGAI Atsushi
- Japan Atomic Energy Research Institute, Naka Fusion Research Establishment
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- Sakamoto Keishi [他] SAKAMOTO Keishi
- Japan Atomic Energy Research Institute, Naka Fusion Research Establishment
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- TSUNEOKA Masaki
- Japan Atomic Energy Research Institute, Naka Fusion Research Establishment
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- IMAI Tsuyoshi
- Japan Atomic Energy Research Institute, Naka Fusion Research Establishment
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Author(s)
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- Takahashi Koji TAKAHASHI Koji
- Japan Atomic Energy Research Institute, Naka Fusion Research Establishment
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- Kasugai Atsushi KASUGAI Atsushi
- Japan Atomic Energy Research Institute, Naka Fusion Research Establishment
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- Sakamoto Keishi [他] SAKAMOTO Keishi
- Japan Atomic Energy Research Institute, Naka Fusion Research Establishment
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- TSUNEOKA Masaki
- Japan Atomic Energy Research Institute, Naka Fusion Research Establishment
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- IMAI Tsuyoshi
- Japan Atomic Energy Research Institute, Naka Fusion Research Establishment
Abstract
It was measured that the dielectric permittivity of sapphire window changed with temperature rise at the frequencies of 110.0 GHz and 170.0 GHz. The permittivity ε varied from 9.4 to 10.0 at 170.0 GHz with temperature rise from 300 K to 630 K, which can cause a significant rf reflection at the surface of the window and degrade gyrotron oscillation. The permittivity change should be considered for the window design of high power, long pulse gyrotrons and transmission.
Journal
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 35(8), 4413-4416, 1996-08-15
The Japan Society of Applied Physics
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