Measurement of Temperature Dependence of Dielectric Permittivity of Sapphire Window for High Power Gyrotrons.

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  • Takahashi Koji
    Japan Atomic Energy Research Institute, Naka Fusion Research Establishment, Naka, Ibaraki 311–01, Japan
  • Kasugai Atsushi
    Japan Atomic Energy Research Institute, Naka Fusion Research Establishment, Naka, Ibaraki 311–01, Japan
  • Sakamoto Keishi
    Japan Atomic Energy Research Institute, Naka Fusion Research Establishment, Naka, Ibaraki 311–01, Japan
  • Tsuneoka Masaki
    Japan Atomic Energy Research Institute, Naka Fusion Research Establishment, Naka, Ibaraki 311–01, Japan
  • Imai Tsuyoshi
    Japan Atomic Energy Research Institute, Naka Fusion Research Establishment, Naka, Ibaraki 311–01, Japan

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  • Measurement of Temperature Dependence o

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It was measured that the dielectric permittivity of sapphire window changed with temperature rise at the frequencies of 110.0 GHz and 170.0 GHz. The permittivity ε varied from 9.4 to 10.0 at 170.0 GHz with temperature rise from 300 K to 630 K, which can cause a significant rf reflection at the surface of the window and degrade gyrotron oscillation. The permittivity change should be considered for the window design of high power, long pulse gyrotrons and transmission.

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