Study on Zr-Si/W (100) Surface at High Temperatures by Combined Surface Analysis Techniques
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The basic mechanism of electron emissivity of a Zr-Si/W(100) surface, which has attracted much attention as a thermal field emitter for practical use, was studied by Auger electron spectroscopy, ion scattering spectroscopy and work function measurements. The results show that the topmost atomic layer consists of Zr and Si at operating conditions (~ 1300 K, 10<SUP>-9</SUP> Torr), the work function of which is slightly reduced by an order of half an eV from that of a clean W(100) surface.
- Japanese Journal of Applied Physics
Japanese Journal of Applied Physics 37(8), 4561-4562, 1998-08-15
The Japan Society of Applied Physics