Study on Zr-Si/W(100) Surface at High Temperatures by Reflection High Energy Electron Diffraction
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Reflection High Energy Electron Diffraction study has revealed that a Zr-Si/W(100) surface has an island structure at the operating temperature of ~ 1300 K. The structure hardly changes when the sample temperature is lowered to room temperature. This result has confirmed the previous work that the Zr-Si/W(100) system does not undergo phase transition as does the Zr-O/W(100) system at ~ 1000 K. The surface properties of the Zr-Si/W(100) system, so long as surface characterization is concerned, hardly change in the range of sample temperature between operating temperature and room temperature.
- Japanese Journal of Applied Physics
Japanese Journal of Applied Physics 38(5), 2951-2952, 1999-05-01
The Japan Society of Applied Physics