Near-Field Scanning Optical Microscope with a Laser Trapped Probe.
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- Kawata Satoshi
- Department of Applied Physics, Osaka University, Suita, Osaka 565
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- Inouye Yasushi
- Department of Applied Physics, Osaka University, Suita, Osaka 565
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- Sugiura Tadao
- Department of Applied Physics, Osaka University, Suita, Osaka 565
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抄録
We made an experiment of near-field microscopic imaging using a laser-beam trapped probe. Differently from a conventional near-field (and/or photon-tunneling) scanning optical microscope, the probe is physically isolated from the scanning microscope system; it is trapped and scanned on the sample surface by the radiation force of near-infrared laser beam. The distance between the probe and the sample surface is maintained to be constant (zero) during scanning. Another laser beam for microscopic imaging is incident on the sample surface in the condition of total internal reflection; the probe on the sample couples with the photons localized near the sample surface as the evanescent filed and scatters out. The scattered photons are collected through an microscope objective lens, which is the same lens as the one used for focusing the infrared laser beam on the probe. A near-field image of the sample surface is formed, as the probe is laterally scanned on the sample. The experimental setup of the proposed microscope is described and the image data obtained with the developed microscope are shown for refractive samples and fluorescent samples with sub micrometer structure.
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 33 (12A), L1725-L1727, 1994
The Japan Society of Applied Physics
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詳細情報 詳細情報について
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- CRID
- 1390282681224056448
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- NII論文ID
- 210000036696
- 110003921615
- 130004519590
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- NII書誌ID
- AA10650595
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- COI
- 1:CAS:528:DyaK2MXisFylsbw%3D
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- ISSN
- 13474065
- 00214922
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- 本文言語コード
- en
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- データソース種別
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- JaLC
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- 抄録ライセンスフラグ
- 使用不可