Simultaneous Observation of Atomically Resolved AFM/STM Images of a Graphite Surface

• Sugawara Yasuhiro

  Department of Electronic Engineering, Faculty of Engineering, Iwate University

• Ishizaka Tatsuya

  Research Institute of Electrical Communication, Tohoku University

• Morita Seizo

  Department of Electronic Engineering, Faculty of Engineering, Iwate University

• Imai Syozo

  Research Institute of Electrical Communication, Tohoku University

• Mikoshiba Nobuo

  Research Institute of Electrical Communication, Tohoku University

抄録

We constructed an AFM/STM system with a conductive lever. We applied this system to the observation of a graphite surface in air. As a result, for the first time, atomically resolved AFM and STM images were obtained simultaneously, and it was found that the lattice pattern appearing in the AFM image was different from that in the STM image. In both AFM and STM images, distortion of lattice periodicity due to frictional effect was observed.

収録刊行物

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 29 (1), L157-L159, 1990

  社団法人応用物理学会

キーワード

• atomic force microscope/scanning tunneling microscope
• AFM/STM
• atomic force microscope
• AFM
• scanning tunneling microscope
• STM
• graphite surface
• atomically resolved image
• contact force
• surface conductance

詳細情報

• CRID: 1572543027196161664
• NII論文ID: 110003923074
• NII書誌ID: AA10650595
• 本文言語コード: en
• データソース種別:
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