Observation of Si(001) Surface Domains in Absorption Current Images of an Electron Microscope
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We investigated a Si(001) surface by scanning electron microscopy when an electron beam was incident at grazing angles on it. The absorption current images were taken using the signal of the absorbed current in a sample. The 2× 1 domains and the 1× 2 domains were distinguished in the absorption current images, and the contrast of the domains was reversed by changing the incident conditions. The 2× 1 domain has a 2× 1 dimer perpendicular to the incident beam and the 1× 2 dimer is perpendicular to the 2× 1 dimer. The contrast in the absorption current images was due to the anisotropical properties of the dimer on the Si(001) surface; the surface potential or the cross section of the released electrons.
- Japanese Journal of Applied Physics
Japanese Journal of Applied Physics 35(4), L458-L459, 1996-04-01
The Japan Society of Applied Physics