High Mobility Thin Film Transistors Fabricated on a Plastic Substrate at a Processing Temperature of 110℃
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- タイトル別名
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- High Mobility Thin Film Transistors Fabricated on a Plastic Substrate at a Processing Temperature of 110ドC
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抄録
<jats:p> We present results from excimer laser processed poly-silicon thin film transistors fabricated on a plastic substrate. Except for the temperature rise during excimer laser irradiation for crystallization, the highest processing temperature that the substrate was subjected to was 110°C. Transistor field-effect mobility of 250 cm<jats:sup>2</jats:sup>/V·s and sub-threshold swing of 0.16 V/decade were measured in these devices. These are the best characteristics reported to date for a thin film transistor (TFT) on a plastic substrate. The performance is attributed to our optimized laser crystallization process of helium sputtered Si films, laser-assisted low-temperature doping processes, and transient annealing. </jats:p>
収録刊行物
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- Japanese journal of applied physics. Pt. 2, Letters
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Japanese journal of applied physics. Pt. 2, Letters 39 (3A/B), L179-181, 2000-03
Tokyo : Japan Society of Applied Physics
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詳細情報 詳細情報について
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- CRID
- 1524232505702180096
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- NII論文ID
- 210000048398
- 110003928579
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- NII書誌ID
- AA10650595
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- ISSN
- 00214922
- 13474065
- http://id.crossref.org/issn/13474065
- http://id.crossref.org/issn/00214922
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- NDL書誌ID
- 5319960
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- 本文言語コード
- en
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- NDL 雑誌分類
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- ZM35(科学技術--物理学)
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- データソース種別
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- NDL
- Crossref
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