Dynamic Study of Stacking Fault Tetrahedra Induced by Electron Irradiation in Copper Crystals

• Hiroshi Fujita

• Takao Sakata

• Hideaki Fukuyo

抄録

The behavior of stacking fault tetrahedra (SFT) induced by electron irradiation in copper crystals has been investigated with a high-voltage electron microscope, concentrating especially on a) the growth of individual SFT, and b) the formation of linear arrays of SFT in the <100> direction. The effects of accelerating voltage, specimen temperature and dose rate of electrons on the behavior of SFT have also been examined.

収録刊行物

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 21 (4A), L235-, 1982-04-01

  IOP Publishing

キーワード

• General Physics and Astronomy
• General Engineering

詳細情報

• CRID: 1360847871767864192
• NII論文ID: 110003928989
• NII論文ID: 210000022097
• NII書誌ID: AA00693547
• DOI: 10.1143/jjap.21.l235
• ISSN: 13474065
• ISSN: 00214922
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.21.L235
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.21.L235/pdf
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