Nanometer-sized phase-change recording using a scanning near-field optical microscope with a laser diode, Jpn

  • Hosaka Sumio
    Advanced Research Laboratory, Hitachi Ltd., 1–280 Higashi–Koigakubo, Kokubunji, Tokyo 185, Japan
  • Shintani Toshimichi
    Advanced Research Laboratory, Hitachi Ltd., 1–280 Higashi–Koigakubo, Kokubunji, Tokyo 185, Japan
  • Miyamoto Mitsuhide
    Advanced Research Laboratory, Hitachi Ltd., 1–280 Higashi–Koigakubo, Kokubunji, Tokyo 185, Japan
  • Hirotsune Akemi
    Central Research Laboratory, Hitachi Ltd., 1–280 Higashi–Koigakubo, Kokubunji, Tokyo 185, Japan
  • Terao Motoyasu
    Central Research Laboratory, Hitachi Ltd., 1–280 Higashi–Koigakubo, Kokubunji, Tokyo 185, Japan
  • Yoshida Masaru
    Hitachi Instruments Service Co., Ltd., Sendagaya, Tokyo 151, Japan
  • Fujita Kouichi
    Nissei–Sangyo Co., Ltd., Nishi–Shimbashi, Tokyo 105, Japan
  • Kämmer Stefan
    TopoMetrix Inc., Santa Clara, California 95054–1162, U.S.A.

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タイトル別名
  • Nanometer-sized Phase-Change Recording using a Scanning Near-Field Optical Microscope with a Laser Diode.

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抄録

We present for the first time a nanometer-sized phase-change recording using a scanning near-field optical microscope (PC-SNOM recording). The recording experiments were performed with a SNOM using a 785-nm-wavelength semiconductor laser diode, shear force detection for gap control and reflected light detection for observing the domains (reading). The recording media of ZnS· SiO2(20 nm)/GeSbTe(30 nm)/ZnS· SiO2(150 nm)/polycarbonate substrate were used. The writings were done at laser powers of 8.4-7.3 mW in the probe for pulse widths of 5 or 0.5 ms. As a result, we obtained a minimum recorded domain size of 60 nm in diameter. This size shows a potential to achieve an ultrahigh density PC-SNOM recording with about 170 Gb/in2. A possibility of achieving high speed readout for the future data storage is also discussed.

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