Critical Condition of Twist-Domain Generation and the Effect of Pretilt Angles on Such Generation in Twisted Nematic Liquid Crystal Cells

• Nakano Fumio

  Hitachi Research Laboratory, Hitachi, Ltd.

• Isogai Masato

  Hitachi Research Laboratory, Hitachi, Ltd.

• Itoh Ren

  Hitachi Research Laboratory, Hitachi, Ltd.

• Satoh Mikio

  Hitachi Research Laboratory, Hitachi, Ltd.

• Kandoh Yasuhiko

  Mobara Works, Hitachi, Ltd.

抄録

The critical conditions governing twist domain generation in twisted nematic cells was investigated theoretically with respect to chiral additives and pretilt angles. It was found that a critical margin twist angle (δ_c) was greatly affected by even a small change in the size of a pretilt angle. The theoretical analysis was supported by the results of experiments that were carried out with various combinations of cell materials, for example, rubbed organic films and organic sealants. This investigation proved that pretilt angle measurement is a useful means of selecting the combination of materials that will result in completely domain-free twisted nematic cells.

収録刊行物

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 20 (8), 1371-1376, 1981

  The Japan Society of Applied Physics

キーワード

• General Physics and Astronomy
• General Engineering

詳細情報

• CRID: 1390001206270282496
• NII論文ID: 110003982110
• NII論文ID: 130003463710
• NII論文ID: 210000021017
• NII書誌ID: AA00690800
• DOI: 10.1143/jjap.20.1371
• ISSN: 13474065
• ISSN: 00214922
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.20.1371
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.20.1371/pdf
• 本文言語コード: en
• データソース種別:
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  • CiNii Articles
• 抄録ライセンスフラグ: 使用不可