Actuation Properties of Lead Zirconate Titanate Thick Films Structured on Si Membrane by the Aerosol Deposition Method.

  • Lebedev Maxim
    \Mechanical Engineering Laboratory, A.I.S.T., M.I.T.I., 1-2 Namiki, Tsukuba, Ibaraki 305-8564, Japan JST cooperative researcher, 4-1-8 Honmachi, Kawaguchi, Saitama 332-0012, Japan
  • Akedo Jun
    \Mechanical Engineering Laboratory, A.I.S.T., M.I.T.I., 1-2 Namiki, Tsukuba, Ibaraki 305-8564, Japan
  • Akiyama Yoshikazu
    R&D Center RICOH Co., Ltd., 16-1 Shinei, Tsuzuki, Yokohama 224-0035, Japan

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The results of the direct deposition of lead zirconate titanate [Pb(Zr0.52, Ti0.48)O3] (PZT) thick film on a Si-based structure are presented. The construction of a bottom electrode is very important for successful deposition. The actuation properties of PZT on the Si membrane were investigated. For a 6.2× 6.1 mm2, 65-μm-thick Si membrane driven by a 4.7× 4.3 mm2, 13-μm-thick PZT layer, the deflections, which were 1.5 μm upon applying 52 V at nonresonance frequency and 22 μm upon applying 8 V at resonance frequency, were measured.

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