Actuation Properties of Lead Zirconate Titanate Thick Films Structured on Si Membrane by the Aerosol Deposition Method.
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- Lebedev Maxim
- \Mechanical Engineering Laboratory, A.I.S.T., M.I.T.I., 1-2 Namiki, Tsukuba, Ibaraki 305-8564, Japan JST cooperative researcher, 4-1-8 Honmachi, Kawaguchi, Saitama 332-0012, Japan
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- Akedo Jun
- \Mechanical Engineering Laboratory, A.I.S.T., M.I.T.I., 1-2 Namiki, Tsukuba, Ibaraki 305-8564, Japan
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- Akiyama Yoshikazu
- R&D Center RICOH Co., Ltd., 16-1 Shinei, Tsuzuki, Yokohama 224-0035, Japan
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抄録
The results of the direct deposition of lead zirconate titanate [Pb(Zr0.52, Ti0.48)O3] (PZT) thick film on a Si-based structure are presented. The construction of a bottom electrode is very important for successful deposition. The actuation properties of PZT on the Si membrane were investigated. For a 6.2× 6.1 mm2, 65-μm-thick Si membrane driven by a 4.7× 4.3 mm2, 13-μm-thick PZT layer, the deflections, which were 1.5 μm upon applying 52 V at nonresonance frequency and 22 μm upon applying 8 V at resonance frequency, were measured.
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 39 (9B), 5600-5603, 2000
The Japan Society of Applied Physics
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詳細情報 詳細情報について
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- CRID
- 1390282681229857536
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- NII論文ID
- 110004055597
- 30021820602
- 130004527760
- 210000047842
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- NII書誌ID
- AA10457675
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- COI
- 1:CAS:528:DC%2BD3cXnt1yht7s%3D
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- ISSN
- 13474065
- 00214922
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- NDL書誌ID
- 5535760
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可