Simple X-Ray Dark- and Bright-Field Imaging Using Achromatic Laue Optics.

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  • Ando Masami
    Photon Factory, Institute of Materials Structure Science, High Energy Accelerator Research Organization (KEK), 1-1 Oho, Tsukuba, Ibaraki 305-0801, Japan Department of Photo-Science, School of Advanced Studies, Graduate University for Advanced Studies (GUAS), Shonan International Village, Hayama, Miura, Kanagawa 240-0193, Japan
  • Maksimenko Anton
    Department of Photo-Science, School of Advanced Studies, Graduate University for Advanced Studies (GUAS), Shonan International Village, Hayama, Miura, Kanagawa 240-0193, Japan
  • Sugiyama Hiroshi
    Photon Factory, Institute of Materials Structure Science, High Energy Accelerator Research Organization (KEK), 1-1 Oho, Tsukuba, Ibaraki 305-0801, Japan Department of Photo-Science, School of Advanced Studies, Graduate University for Advanced Studies (GUAS), Shonan International Village, Hayama, Miura, Kanagawa 240-0193, Japan
  • Pattanasiriwisawa Wanwisa
    Department of Photo-Science, School of Advanced Studies, Graduate University for Advanced Studies (GUAS), Shonan International Village, Hayama, Miura, Kanagawa 240-0193, Japan
  • Hyodo Kazuyuki
    Photon Factory, Institute of Materials Structure Science, High Energy Accelerator Research Organization (KEK), 1-1 Oho, Tsukuba, Ibaraki 305-0801, Japan Department of Material Structure Science, School of Physical Mathematics, Graduate University for Advanced Studies (GUAS), 1-1 Oho, Tsukuba, Ibaraki 305-0801, Japan
  • Uyama Chikao
    Department of Clinical Engineering, Faculty of Health Sciences, Hiroshima International University, Kurose-chou, Kamo-gun, Hiroshima 724-0695, Japan

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Abstract

X-ray dark-field and bright-field imaging in the Laue geometry has been successfully demonstrated. Using a Bragg-case asymmetric monochromator that produces an X-ray beam with a 0.3 μrad divergence incident onto an object and a Laue geometry analyzer that can simultaneously provide dark-field imaging (DFI) and bright-field imaging (BFI). The DFI has only an X-ray refraction component on the object without illumination, while the BFI has reasonable illumination. This was achieved by a 1.075 mm thick silicon analyzer with 4, 4, 0 diffraction at 35 keV X-ray photon energy. An image of an insect embedded in polymethylmethacrylate, which can not be visualized by absorption, has been obtained.

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