Artifact and Fact of Si(111)7×7 Surface Images Observed with a Low Temperature Noncontact Atomic Force Microscope(LT-NC-AFM)
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- Suehira Nobuhito
- Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan
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- Sugawara Yasuhiro
- Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan
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- Morita Seizo
- Department of Electronic Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan
書誌事項
- タイトル別名
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- Artifact and Fact of Si(111)7*7 Surface Images Observed with a Low Temperature Noncontact Atomic Force Microscope (LT-NC-AFM).
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抄録
We investigate Si(111)7×7 surface by using a low temperature noncontact atomic force microscope (LT-NC-AFM). We obtain two types of AFM images with and without an additional structure between the corner and center adatoms. The distance between the corner adatom and additional structure is 7.0 ű0.2 Å, which is not consistent with that (4.3 Å) between the corner adatom and the rest atom. This suggests that the additional structure observed is an artifact. We propose a model to explain these experimental results, which is based on atomic arrangement of the Si tip apex with an asymmetric ad-dimer and the Si(111)7×7 surface.
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 40 (3B), L292-L294, 2001
The Japan Society of Applied Physics
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詳細情報 詳細情報について
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- CRID
- 1390001206251892096
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- NII論文ID
- 210000050650
- 110004085514
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- NII書誌ID
- AA10650595
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- ISSN
- 13474065
- 00214922
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- NDL書誌ID
- 5714599
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
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- 抄録ライセンスフラグ
- 使用不可