X線分析装置XRF-1800による岩石の定量化学分析

中崎 峰子, 壷井 基裕, 金川 和世, 加藤 丈典, 鈴木 和博, Nakazaki Mineko, Tsuboi Motohiro, Kanagawa Kazuyo, Katou Takenori, Suzuki Kazuhiro

doi:10.18999/bulnum.020.07

X線分析装置XRF-1800による岩石の定量化学分析

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タイトル別名

Quantitative chemical analysis of rocks with X-ray fluorescence analyzer XRF-1800
Xセンブンセキソウチ XRF 1800 ニヨルガンセキノテイリョウカガクブンセキ

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This paper describes analytical procedures to determine 10 major and 15 trace elements in silicate rocks, using an X-ray fluorescence analyzer (Shimadzu SFX 1800) with a Rh target at the Center for Chronological Research, Nagoya University. Analyses are carried out on glass bead prepared through fusion of sample and flux (Li2B4O7) mixture in the proportion of 0.7g : 6.0g for major elements (Si, Ti, Al, Fe, Mn, Mg, Ca, Na, K, P) and 2g : 3g for trace elements (V, Cr, Co, Ni, Cu, Zn, As, Rb, Sr, Y, Zr, Nb, Ba, Pb,Th). Calibration curves for the major elements cover a wide compositional range of igneous, metamorphic and sedimentary silicate rocks. Calibration curves for the trace elements are corrected for spectral line-overlap and matrix effect, and carry out reliable analyses at concentration above 2-10ppm.