基準電極の違いが事象関連電位に及ぼす影響

• 宮谷 真人

• 中尾 美月

• 山本 文枝

• 岩木 信喜

• 藤本 里奈

書誌事項

タイトル別名

• Differences of event-related potentials with use of different reference sites
• キジュン デンキョク ノ チガイ ガ ジショウ カンレン デンイ ニ オヨボス エイキョウ

抄録

In this article, the influence of different reference electrodes on the scalp distribution of event-related potentials (ERPs) was evaluated. The search-related negativity (SN) is one of negative ERP component which varies with memory and display load in a visual search task. The amplitude and topography of SN were sensitive to the selection of reference site. The effects of memory and display load at frontal and temporal sites were larger when ERPs were referred to tip of nose compared with linked-ear reference. In contrast, the attenuation of N400 due to semantic relation between word pairs was almost invariable with use of different reference sites. These results suggest that optimal reference electrode selection depends on what component of ERPs is a research target, and has to be evaluated not only theoretically but also empirically.

収録刊行物

• 広島大学大学院教育学研究科紀要. 第三部, 教育人間科学関連領域

  広島大学大学院教育学研究科紀要. 第三部, 教育人間科学関連領域 50 301-308, 2002-02-28

  広島大学大学院教育学研究科

キーワード

• 事象関連電位
• 基準電極
• 頭皮上分布
• 探索陰性電位
• N400
• Event-related potentials
• Reference electrode
• Scalp distribution
• Search negativity

詳細情報

• CRID: 1390572174806889984
• NII論文ID: 110004680801
• NII書誌ID: AA11625039
• ISSN: 13465562
• DOI: 10.15027/18421
• NDL書誌ID: 6200398
• Web Site: http://ir.lib.hiroshima-u.ac.jp/00018421
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I6200398
• 本文言語コード: ja
• データソース種別:
  • JaLC
  • IRDB
  • NDL
  • CiNii Articles
• 抄録ライセンスフラグ: 使用可