Holographic Analysis of Incident Electron Beam Angular Distribution of Characteristic X-rays: Internal Detector Electron Holography

• Hayashi Kouichi

  Institute for Materials Research, Tohoku University

• Matsushita Tomohiro

  Japan Synchrotron Radiation Research Institute (JASRI), SPring-8

• Matsubara Eiichiro

  Department of Materials Science and Engineering, Kyoto University

Abstract

The incident electron beam angular distribution of Ti Kα characteristic X-rays from a strontium titanate single crystal was measured by scanning electron microscopy. The isotropy exhibits typical features observed in conventional photoelectron holography. Reconstructions by Fourier-transformation-based algorithm clearly show neighboring Sr and Ti atoms around Ti, the validity of which was verified by computer simulation. The demonstration paves the way to obtaining multiple energy holograms of nanostructured materials using the energy tunability of focused electron beams.

Journal

• Journal of the Physical Society of Japan

  Journal of the Physical Society of Japan 75 (5), 053601-, 2006

  THE PHYSICAL SOCIETY OF JAPAN

Keywords

• photoelectron holography
• local structure
• crystal structure
• characteristic X-rays
• electron microscopy

Details

• CRID: 1390001204190405376
• NII Article ID: 110004702307
• NII Article ID: 210000106129
• NII Book ID: AA00704814
• DOI: 10.1143/jpsj.75.053601
• BIBCODE: 2006JPSJ...75e3601H
• ISSN: 13474073
• ISSN: 00319015
• NDL BIB ID: 7907876
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I7907876
• Web Site: http://journals.jps.jp/doi/pdf/10.1143/JPSJ.75.053601
• Text Lang: en
• Data Source:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
• Abstract License Flag: Disallowed