Crack Length Measurement with an Ion Sputtered Film

• DENG Gang

  Department of Mechanical Systems Engineering, University of Miyazaki

• TOKUNAGA Hitoo

  宮崎大学大学院工学研究科

• REDDA Tilahun Daniel

  宮崎大学大学院工学研究科

• IKEDA Kiyohiko

  Department of Mechanical Systems Engineering, University of Miyazaki

• NAKANISHI Tsutomu

  Department of Mechanical Systems Engineering, University of Miyazaki

• KAIZU Koichi

  Department of Mechanical Systems Engineering, University of Miyazaki

Bibliographic Information

Other Title

• スパッタ金属膜によるき裂長さの測定
• スパッタ キンゾク マク ニ ヨル キレツ ナガサ ノ ソクテイ

Abstract

Crack length measurement and crack initiation detection in a fatigue process are extremely important techniques in the researches for the investigation of crack growth characteristics and the fatigue strength evaluation of machine elements. The purpose of this research is to show a simple and high precision method to measure the length of a crack as well as a micro crack using an extremely thin ion sputtered film. A grid pattern ion sputtered film was proposed to measure the crack length for a bending test specimen. Based on the comparisons between the measurement results and that by a microscope, it was clarified that the grid pattern ion sputtered film has a very high measurement precision. This method should be invaluable and practicable for the crack length measurement of insulating materials such as ceramics. Meanwhile, a rectangle ion sputtered film was used on a metal bending specimen, the possibility to apply the film in the crack length measurement of a metal machine element was confirmed by the change of the electric resistance of the film with crack growth.

Journal

• TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS Series C

  TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS Series C 72 (715), 997-1002, 2006

  The Japan Society of Mechanical Engineers

Keywords

• Crack Length Measurement
• Thin Film
• Ion Sputtered Film
• Micro-Crack

Details

• CRID: 1390282681364962432
• NII Article ID: 110004702527
• NII Book ID: AN00187463
• DOI: 10.1299/kikaic.72.997
• COI: 1:CAS:528:DC%2BD28XltFais7o%3D
• ISSN: 18848354
• ISSN: 03875024
• HANDLE: 10458/767
• NDL BIB ID: 7906387
• Web Site: https://miyazaki-u.repo.nii.ac.jp/records/967
• Web Site: http://id.ndl.go.jp/bib/7906387
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I7906387
• Web Site: https://www.jstage.jst.go.jp/article/kikaic1979/72/715/72_715_997/_pdf
• Data Source:
  • JaLC
  • IRDB
  • NDL
  • Crossref
  • CiNii Articles
  • KAKEN
• Abstract License Flag: Disallowed