Observation of Low-Temperature Elastic Softening due to Vacancy in Crystalline Silicon

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Abstract

In challenging a direct observation of the vacancy in crystalline silicon, we have carried out low-temperature ultrasonic measurements down to 20 mK. The longitudinal elastic constants of non-doped and B-doped crystalline silicons, which were grown by a floating zone (FZ) method in commercial base, reveal the elastic softening proportional to the reciprocal temperature below 20 K. The applied magnetic fields turn the elastic softening of the B-doped FZ silicon to a temperature-independent behavior, while the fields up to 16 T do not affect the elastic softening of the non-doped FZ silicon. We present a plausible scenario for this result. Namely the vacancy with the non-magnetic charge state <I>V</I><SUP>0</SUP> in the non-doped silicon and the magnetic <I>V</I><SUP>+</SUP> in the B-doped silicon is responsible for the low-temperature softening of the shear elastic constants (<I>C</I><SUB>11</SUB>−<I>C</I><SUB>12</SUB>)⁄2 and <I>C</I><SUB>44</SUB>, which can be described in terms of the quadrupole susceptibility due to the Jahn–Teller effect.

Journal

  • Journal of the Physical Society of Japan

    Journal of the Physical Society of Japan 75(4), "44602-1"-"44602-6", 2006-04-15

    The Physical Society of Japan (JPS)

References:  29

  • <no title>

    KATO M.

    Jpn. J. Appl. Phys. 35, 5597, 1996

    Cited by (1)

  • <no title>

    HOURAI M.

    Semiconductor Silicon 1998 PV 98-1, 453, 1999

    Cited by (1)

  • <no title>

    KIM H. S.

    Jpn. J. Appl. Phys. 40, L1286, 2001

    Cited by (1)

  • <no title>

    TSUYA H.

    Jpn. J. Appl. Phys. 43, 4055, 2004

    Cited by (1)

  • <no title>

    COULSON C. A.

    Proc. R. Soc. London, Ser. A 241, 433, 1957

    Cited by (1)

  • <no title>

    LANNOO L.

    Phys. Rev. B 24, 955, 1981

    Cited by (1)

  • <no title>

    SCHLUTER M.

    Proc. Int. School of Physics "Enrico Fermi", 1985, 1985

    Cited by (1)

  • <no title>

    BRUNER L. G.

    Phys. Rev. Lett. 7, 55, 1961

    Cited by (1)

  • <no title>

    HALL J. J.

    Phys. Rev. 161, 756, 1967

    Cited by (1)

  • <no title>

    KWOK P. C.

    Phys. Rev. 149, 666, 1966

    Cited by (1)

  • <no title>

    SUZUKI K.

    Phys. Rev. Lett. 28, 94, 1972

    Cited by (1)

  • <no title>

    KITTEL C.

    Introduction to Solid State Physics, 1996

    Cited by (1)

  • <no title>

    KATAOKA M.

    J. Phys. Soc. Jpn. 32, 113, 1972

    Cited by (1)

  • <no title>

    THALMEIER P.

    Handbook on the Physics and Chemistry of Rare Earths 14, Chap. 96, 1991

    Cited by (1)

  • <no title>

    SCHIFF L. L.

    Quantum Mechanics, 1968

    Cited by (1)

  • <no title>

    ONUKI Y.

    Handbook on the Physics and Chemistry of Rare Earths 20, Chap. 135, 1995

    Cited by (1)

  • <no title>

    GOTO T.

    Phys. Rev. B 70, 184126, 2004

    Cited by (1)

  • <no title>

    VORONKOV V. V.

    J. Cryst. Growth 59, 625, 1982

    Cited by (4)

  • <no title>

    WATKINS G. D.

    Phys. Rev. Lett. 44, 593, 1980

    Cited by (2)

  • <no title>

    DANNEFAER S.

    Phys. Rev. Lett. 56, 2195, 1986

    Cited by (3)

  • <no title>

    BARAFF G. A.

    Phys. Rev. B 21, 5662, 1980

    Cited by (2)

  • <no title>

    KLEIMAN R. N.

    Phys. Rev. Lett. 59, 2079, 1987

    Cited by (1)

  • <no title>

    COECK M.

    Phys. Rev. B 58, 6708, 1998

    Cited by (1)

  • <no title>

    PHILIPS W. A.

    Phys. Rev. Lett. 61, 2632, 1988

    Cited by (1)

  • <no title>

    FULDE P.

    Solid State Phys. 41, 1, 1988

    Cited by (4)

  • <no title>

    GEHRING G. A.

    Rep. Prog. Phys. 38, 1, 1975

    Cited by (3)

  • Crystal-Originated Singularities on Si Wafer Surface after SC1 Cleaning

    Ryuta Jiro , Morita Etsuro , Tanaka Toshiro , Shimanuki Yasushi

    Japanese Journal of Applied Physics 29pt2(11), L1947-L1949, 1990

    Cited by (15)

  • Quadrupole-Strain Interaction in Rare Earth Hexaborides

    NAKAMURA S. , Goto Terutaka , Kunii Satoru , Iwashita Katsuhiko , Tamaki Akira

    Journal of the Physical Society of Japan 63(2), p623-636, 1994-02

    Cited by (5)

  • Elastic Properties of NaCl:OH at Low Temperatures

    KANDA E. , GOTO Terutaka , YAMADA Hiroshi , SUTO Shozo , TANAKA Satoshi , FUJITA Toshizo , FUJIMURA Tadao

    Journal of the Physical Society of Japan 54(1), p175-185, 1985-01

    Cited by (2)

Cited by:  1

Codes

  • NII Article ID (NAID)
    110004729265
  • NII NACSIS-CAT ID (NCID)
    AA00704814
  • Text Lang
    ENG
  • Article Type
    Journal Article
  • ISSN
    00319015
  • NDL Article ID
    7882403
  • NDL Source Classification
    ZM35(科学技術--物理学)
  • NDL Call No.
    Z53-A404
  • Data Source
    CJP  CJPref  NDL  NII-ELS  J-STAGE 
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