High Space-Resolutive Evaluation of Subsurface Stress Distribution by Strain Scanning Method with Analyzer Using High-Energy Synchrotron X-Rays
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- SHOBU Takahisa
- Synchrotron Radiation Research Unit, Quantum Beam Science Directorate, Japan Atomic Energy Agency
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- MIZUKI Jun’ichiro
- Synchrotron Radiation Research Unit, Quantum Beam Science Directorate, Japan Atomic Energy Agency
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- SUZUKI Kenji
- Department of Technology and Living Sciences, Niigata University
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- AKINIWA Yoshiaki
- Department of Mechanical Engineering, Nagoya University
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- TANAKA Keisuke
- Department of Mechanical Engineering, Nagoya University
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Abstract
The surface aberration effect in the strain scanning method with a Ge analyzer was examined using high- energy X-rays from the undulator synchrotron source. The synchrotron X-rays from the undulator source had an enough intensity for the strain scanning method using a goniometer with the analyzer. The use of a Ge (111) analyzer showed remarkable reduction of the surface aberration effect. However, there still existed the surface aberration for the very-near surface region from the surface to the depth of 50µm. A correction method was proposed by taking into account of the effects of the divergence of the Ge analyzer, the mis-setting of the analyzer and the X-ray attenuation. The proposed correction method was very useful for eliminating the surface aberration effect. The correction method enables a high space-resolutive evaluation of the subsurface stress distribution. The method was successfully applied to the determination of the residual stress distribution of the shot-peened steel. A precise d0 value of the strain-free lattice spacing necessary was determined from the surface stress measured by the conventional sin2ψ method using Cr-Kα radiation.
Journal
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- JSME International Journal Series A
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JSME International Journal Series A 49 (3), 376-381, 2006
The Japan Society of Mechanical Engineers
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Keywords
Details 詳細情報について
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- CRID
- 1390282681469128320
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- NII Article ID
- 110004798973
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- NII Book ID
- AA11179396
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- ISSN
- 13475363
- 13447912
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- HANDLE
- 10191/18176
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- NDL BIB ID
- 7976603
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- Text Lang
- en
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- Data Source
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- JaLC
- IRDB
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed