Measurement of Residual Stress Distribution by Strain Scanning Method using High Energy X-rays from Synchrotron Source

• MACHIYA Shutaro

  Department of Mechanical Engineering, Nagoya University

• AKINIWA Yoshiaki

  名古屋大学工学研究科

• SUZUKI Kenji

  新潟大学教育人間科学部生活環境学科

• TANAKA Keisuke

  名古屋大学工学研究科

• KURIMURA Takayuki

  三菱重工業 (株) 高砂研究所

• OGUMA Hidetaka

  三菱重工業 (株) 高砂研究所

Bibliographic Information

Other Title

• 高エネルギー放射光を用いたひずみスキャニング法による残留応力分布測定
• コウエネルギー ホウシャコウ オ モチイタ ヒズミ スキャニングホウ ニ ヨル ザンリュウ オウリョク ブンプ ソクテイ

Abstract

A residual stress distribution in thermal barrier coatings can be measured using the strain scanning method with high energy X-rays from a synchrotoron source due to its large penetration depth. For the double slits optics, the peak aberration of the measured diffraction becomes large, when the gage volume crosses the surface. The analytical correction method for the peak aberration was proposed in this paper. The surface aberration effect was corrected by taking account of the difference between the center of the goniometer and the optical centroid of the gage volume. Using the correction method, the distribution of the residual stress in thermal barrier coatings were measured from the surface to about 0.26 mm inside. For the as-sprayed top coating, the in-plane residual stress was approximately 30 MPa, and out-of-plane stress increased near by interface. For the coating subjected to the heat cycle (1773 K), the both residual stress were relesed.

Journal

• TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS Series A

  TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS Series A 71 (711), 1530-1537, 2005

  The Japan Society of Mechanical Engineers

Keywords

• Thermal Barrier Coating
• X-ray Stress Measurement
• Residual Stress
• Strain Scanning
• Ceramics
• Synchrotron

Details

• CRID: 1390282679455400320
• NII Article ID: 110004999114
• NII Book ID: AN0018742X
• DOI: 10.1299/kikaia.71.1530
• COI: 1:CAS:528:DC%2BD28XhtlGru7c%3D
• ISSN: 18848338
• ISSN: 03875008
• HANDLE: 10191/5716
• NDL BIB ID: 7741687
• Web Site: https://niigata-u.repo.nii.ac.jp/records/3680
• Web Site: http://id.ndl.go.jp/bib/7741687
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I7741687
• Web Site: http://www.jstage.jst.go.jp/article/kikaia1979/71/711/71_711_1530/_pdf
• Text Lang: ja
• Data Source:
  • JaLC
  • IRDB
  • NDL
  • Crossref
  • CiNii Articles
  • KAKEN
• Abstract License Flag: Disallowed