Crack Length Measurement with an Ion Sputtered Metal Film

• DENG Gang

  Department of Mechanical Systems Engineering, University of Miyazaki

• NASU Koutarou

  ヤマザキマザック (株)

• KUROIWA Syuuhei

  ヤマザキマザック (株)

• NAKANISHI Tsutomu

  Department of Mechanical Systems Engineering, University of Miyazaki

Bibliographic Information

Other Title

• 一枚型イオンスパッタ金属膜によるき裂長さの測定
• イチマイガタ イオンスパッタ キンゾク マク ニ ヨル キレツ ナガサ ノ ソクテイ

Abstract

This research developed a simple and high precision method to measure the length of a fatigue crack using an extremely thin ion sputtered metal film based on that the electric resistance of the film changes with the increase of the crack. The electric resistance of a cracked film was calculated by the electrothermal FEM analysis. Based on the FEM analysis results, the relationship between the electric resistance and crack length is expressed by a practical formula. Fatigue crack length measurements for acrylic and metal test specimens were performed on the three-points fatigue test equipment. Based on the good agreements between the measurement results by the ion sputtered film and that by the optical microscope, it is clarified that the crack length measurement method with an ion sputtered metal film has a very high precision. In addition that the measurement system is very simple, this method can be said to have a high practical usability.

Journal

• TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS Series C

  TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS Series C 73 (727), 849-854, 2007

  The Japan Society of Mechanical Engineers

Keywords

• Crack Length Measurement
• Thin Film
• Ion Sputtered Film
• Micro-Crack
• Fatigue Crack Detection

Details

• CRID: 1390001206386334080
• NII Article ID: 110006271408
• NII Book ID: AN00187463
• DOI: 10.1299/kikaic.73.849
• ISSN: 18848354
• ISSN: 03875024
• ISSN: http://id.crossref.org/issn/03875024
• HANDLE: 10458/768
• NDL BIB ID: 8758047
• Web Site: https://miyazaki-u.repo.nii.ac.jp/records/890
• Web Site: http://id.ndl.go.jp/bib/8758047
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I8758047
• Web Site: https://www.jstage.jst.go.jp/article/kikaic1979/73/727/73_727_849/_pdf
• Data Source:
  • JaLC
  • IRDB
  • NDL
  • Crossref
  • CiNii Articles
  • KAKEN
• Abstract License Flag: Disallowed