Surface Damage of Whisker-Type Cold Emitter after Overload Test.

• Washio Tsukasa

  Nagaoka University of Technology, Kamitomioka, Nagaoka, Niigata 940-2188, Japan

• Ohkawara Yoshiaki

  Nagaoka University of Technology, Kamitomioka, Nagaoka, Niigata 940-2188, Japan

• Ohshio Shigeo

  Nagaoka University of Technology, Kamitomioka, Nagaoka, Niigata 940-2188, Japan

• Ito Haruhiko

  Nagaoka University of Technology, Kamitomioka, Nagaoka, Niigata 940-2188, Japan

• Saitoh Hidetoshi

  Nagaoka University of Technology, Kamitomioka, Nagaoka, Niigata 940-2188, Japan

抄録

An overload test of a new type of ceramic field emitter, ZnO:Al whisker covered with amorphous hydrogenated carbon nitride film, was performed. The aim of this study is to investigate surface damage of the whisker-type cold emitter under overload conditions. The morphologies of the emitter surface before and after operation were compared using scanning electron microscopy. The emission was terminated after the generation of surge current that severely damaged the emission surface.

収録刊行物

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 41 (9), 5753-5754, 2002

  The Japan Society of Applied Physics

キーワード

• field emission
• ZnO
• whiskers
• plasma CVD
• carbon nitride
• film

詳細情報

• CRID: 1390282681232517248
• NII論文ID: 210000052018
• NII論文ID: 110006341821
• NII書誌ID: AA10457675
• DOI: 10.1143/jjap.41.5753
• ISSN: 13474065
• ISSN: 00214922
• Web Site: http://stacks.iop.org/1347-4065/41/i=9R/a=5753/pdf
• 本文言語コード: en
• データソース種別:
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  • Crossref
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• 抄録ライセンスフラグ: 使用不可