Test Generation for Test Compression Based on Statistical Coding

• ICHIHARA, Hideyuki

• OGAWA, Atsuhiro

• INOUE, Tomoo

• TAMURA, Akiko

• 市原, 英行

• 井上, 智生

抄録

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Test compression/decompression is an efficient method for reducing the test application cost. In this paper we propose a test generation method for obtaining test-patterns suitable to test compression by statistical coding. In general, an ATPG generates a test-pattern that includes don't-care values. In our method, such don't-care values are specified based on an estimation of the final probability of 0/1 occurrence in the resultant test set. Experimental results show that our method can generate test patterns that are able to be highly compressed by statistical coding, in small computational time.

収録刊行物

• IEICE Transactions on Information and Systems

  IEICE Transactions on Information and Systems E85-D (10), 1466-1473, 2002-10-01

  電子情報通信学会(IEICE)

詳細情報

• CRID: 1050015111529981312
• NII論文ID: 110006376575
• NII書誌ID: AA10826272
• ISSN: 09168532
• Web Site: https://hiroshima-cu.repo.nii.ac.jp/records/1312
• 本文言語コード: en
• 資料種別: journal article
• データソース種別:
  • IRDB
  • CiNii Articles