Tc vs n relationship for multilayered high-Tc superconductors

  • Iyo Akira
    Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology (AIST)
  • Tanaka Yasumoto
    Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology (AIST)
  • Kito Hijiri
    Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology (AIST)
  • Kodama Yasuharu
    Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology (AIST)
  • Shirage Parasharam M.
    Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology (AIST)
  • Shivagan Dilip D.
    Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology (AIST)
  • Matsuhata Hirofumi
    Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology (AIST)
  • Tokiwa Kazuyasu
    Faculty of Industrial Science and Technology, Tokyo University of Science
  • Watanabe Tsuneo
    Faculty of Industrial Science and Technology, Tokyo University of Science

書誌事項

タイトル別名
  • <I>T</I><SUB>c</SUB> vs <I>n</I> Relationship for Multilayered High-<I>T</I><SUB>c</SUB> Superconductors

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We have proposed a Tc vs n relationship for multilayered high-Tc superconductors from the analysis of HgBa2Can−1CunOy grain-aligned samples containing n=6 to 16 phases. The sample showed a large and sharp superconducting transition at 105 K in its susceptibility vs temperature curve. This means that multilayered HgBa2Can−1CunOy can maintain a high Tc at least up to n≈16, otherwise many transitions would have been observed. It is generally believed that the highest Tc decreases with n for n≥4–5 for multilayered superconductors. We conclude that the highest Tc is almost constant above about n=5 if the factors reducing Tc, such as disorder, are eliminated for multilayered superconductors. This behavior can be explained using an inhomogeneous charge distribution model in multilayered cuprates.

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