Exact Expressions for Some Dielectric Properties of Ferroelectric Thin Films Based on the Tilley–Zeks Model

• Ishibashi Yoshihiro

  Faculty of Business, Aichi Shukutoku University

• Iwata Makoto

  Department of Engineering Physics, Electronics and Mechanics, Graduate School of Engineering, Nagoya Institute of Technology

• Musleh Ahmad M. A.

  Department of Physics, Science University of Malaysia

抄録

The extrapolation length adopted in the Tilley–Zeks model of ferroelectric thin films plays a substantial role in governing the dielectric properties of thin films through the boundary conditions. The boundary conditions under an applied field are reexamined. The exact formulas for the transition temperature, the dielectric susceptibility, and the Curie constant are obtained for the Tilley–Zeks model of ferroelectric thin films, where various combinations of the extrapolation length are taken into account. The polarization profiles obtained under the applied field may be considered to approximately represent the soft mode.

収録刊行物

• Ｊｏｕｒｎａｌ　ｏｆ　ｔｈｅ　Ｐｈｙｓｉｃａｌ　Ｓｏｃｉｅｔｙ　ｏｆ　Ｊａｐａｎ

  Ｊｏｕｒｎａｌ　ｏｆ　ｔｈｅ　Ｐｈｙｓｉｃａｌ　Ｓｏｃｉｅｔｙ　ｏｆ　Ｊａｐａｎ 76 (10), 104702-104702, 2007

  一般社団法人 日本物理学会

キーワード

• ferroelectric thin film
• Tilley–Zeks model
• extrapolation length
• dielectric susceptibility

詳細情報

• CRID: 1390001204195198208
• NII論文ID: 130005296557
• NII論文ID: 110006448316
• NII論文ID: 210000106923
• NII書誌ID: AA00704814
• DOI: 10.1143/jpsj.76.104702
• ISSN: 13474073
• ISSN: 00319015
• NDL書誌ID: 8948224
• Web Site: http://id.ndl.go.jp/bib/8948224
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I8948224
• Web Site: https://journals.jps.jp/doi/pdf/10.1143/JPSJ.76.104702
• 本文言語コード: en
• データソース種別:
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  • NDL
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• 抄録ライセンスフラグ: 使用不可