Electron Back-Scatter Pattern Analyses of a Recrystallized Al-4mass%Mg Alloy Sheet(Materials, Metallurgy & Weldability)

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Spatial distributions of grain orientation and grain boundary character distribution in a recrystallized Al-4mass%Mg alloy sheet have been investigated using the Electron Back Scatter Pattern (EBSP) method. The evaluation of microstructure was performed for the specimen recrystallized at 773K for 1ks. Weak cube textures were observed for the specimen taken from the central portion of the thickness, and sheared texture component tended to be dominant in the surface region of the sheet. Cube oriented grains existed in both isolated and aggregated sates. The cluster of cube grains tended to contain low angle grain boundaries. Observation of grain boundary migration on the same area revealed heterogeneous behavior of triple junctions resulting in a wide variety of microstructural change.

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  • Trans. JWRI

    Trans. JWRI 30(1), 63-70, 2001

    大阪大学

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各種コード

  • NII論文ID(NAID)
    110006486103
  • NII書誌ID(NCID)
    AA00867058
  • 本文言語コード
    ENG
  • 資料種別
    雑誌論文
  • ISSN
    03874508
  • データ提供元
    CJP引用  NII-ELS 
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