Correction of Surface Aberration in Strain Scanning Method with Analyzer
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- SHOBU Takahisa
- SPring-8 Service Co. Ltd. Japan Atomic Energy Res. Inst.
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- MIZUKI Junichiro
- Japan Atomic Energy Res. Inst.
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- SUZUKI Kenji
- Dept. of Tech. and Living Sci., Niigata Univ.
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- AKINIWA Yoshiaki
- Dept. of Mech. Eng., Nagoya Univ.
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- TANAKA Keisuke
- Dept. of Mech. Eng., Nagoya Univ.
Bibliographic Information
- Other Title
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- アナライザを用いたひずみスキャニング法の表面効果の補正
- アナライザ オ モチイタ ヒズミ スキャニングホウ ノ ヒョウメン コウカ ノ ホセイ
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Abstract
When a gauge volume sank below a specimen surface, the diffraction angle shifts. Thus, it is required to correct the surface aberration. For the annealed specimen of S45C, the shift in the diffraction angle was investigated using a strain scanning method with Ge (111) analyzer. This phenomenon was caused by the difference in the centroid between the geometric and the instrumental gauge volumes. This difference is explained by the following factors; 1) the change in the gauge volume by the divergence of the analyzer, 2) the X-ray penetration depth, 3) the gap of the centre line between the double receiving slits due to mis-setting the analyzer. As a result, the correcting method considered into these factors was proposed. For the shot-peened specimens of S45C, the diffraction angles were measured and corrected by our method. The distribution of the residual stress agreed with that obtained by the removal method.
Journal
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- Journal of the Society of Materials Science, Japan
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Journal of the Society of Materials Science, Japan 55 (1), 101-108, 2006
The Society of Materials Science, Japan
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Details 詳細情報について
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- CRID
- 1390282680394787328
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- NII Article ID
- 110006570832
- 30020595685
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- NII Book ID
- AN00096175
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- ISSN
- 18807488
- 05145163
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- HANDLE
- 10191/18172
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- NDL BIB ID
- 7801146
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- Text Lang
- ja
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- Data Source
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- JaLC
- IRDB
- NDL
- Crossref
- CiNii Articles
- KAKEN
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- Abstract License Flag
- Disallowed