Conductance between Two Scanning-Tunneling-Microscopy Probes in Carbon Nanotubes

• Nakanishi Takeshi

  National Institute of Advanced Industrial Science and Technology

• Ando Tsuneya

  Department of Physics, Tokyo Institute of Technology

抄録

The conductance image between two probes of scanning tunneling microscopy (STM) is calculated in an armchair carbon nanotube within a tight-binding model and a realistic model for STM probes. A Kekulé-type pattern usually appears due to interference of states at K and K′ points except in special cases.

収録刊行物

• Ｊｏｕｒｎａｌ　ｏｆ　ｔｈｅ　Ｐｈｙｓｉｃａｌ　Ｓｏｃｉｅｔｙ　ｏｆ　Ｊａｐａｎ

  Ｊｏｕｒｎａｌ　ｏｆ　ｔｈｅ　Ｐｈｙｓｉｃａｌ　Ｓｏｃｉｅｔｙ　ｏｆ　Ｊａｐａｎ 77 (2), 024703-024703, 2008

  一般社団法人 日本物理学会

キーワード

• graphite
• carbon nanotube
• fullerene tube
• STM
• recursive Green’s function technique

詳細情報

• CRID: 1390001204198370816
• NII論文ID: 130005436359
• NII論文ID: 110006613894
• NII論文ID: 210000107101
• NII書誌ID: AA00704814
• DOI: 10.1143/jpsj.77.024703
• ISSN: 13474073
• ISSN: 00319015
• NDL書誌ID: 9377758
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I9377758
• Web Site: https://journals.jps.jp/doi/pdf/10.1143/JPSJ.77.024703
• 本文言語コード: en
• データソース種別:
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  • NDL
  • Crossref
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  • KAKEN
• 抄録ライセンスフラグ: 使用不可