C-12-4 Study on Diagnostic method of VLSI considering layout-dependent delay variation

• Ninomiya Yukio

  Dept. Information Systems Eng., Grad. Sch. Information Science and Technology, Osaka University

• Miura Katsuyoshi

  Dept. Information Systems Eng., Grad. Sch. Information Science and Technology, Osaka University

• Nakamae Koji

  Dept. Information Systems Eng., Grad. Sch. Information Science and Technology, Osaka University

Bibliographic Information

Other Title

• C-12-4 レイアウト依存バラつきを考慮したVLSI故障診断法の検討(C-12.集積回路ACD,一般講演)

Journal

• Proceedings of the Society Conference of IEICE

  Proceedings of the Society Conference of IEICE 2007 (2), 59-, 2007-08-29

  The Institute of Electronics, Information and Communication Engineers

Details

• CRID: 1573105977064498176
• NII Article ID: 110006629022
• NII Book ID: AN10489017
• Text Lang: ja
• Data Source:
  • CiNii Articles